Books by Chin, Alan K.; Wang, S. C.; Dutta, Niloy K.; Linden, Kurt JClick here for all books by Chin, Alan K.; Wang, S. C.; Dutta, Niloy K.; Linden, Kurt J available for purchase on-line. Testing, Reliability, and Applications of Optoelectronic Devices (SPIE Proceedings Volume 4285) by Chin, Alan K.; Wang, S. C.; Dutta, Niloy K.; Linden, Kurt J listed for sale on Bibliophile Bookbase. Click here for full details and on-line purchase. Bibliophile Bookbase lists over 5 million books, maps and prints including libri rari, out of print books, used books, atlases and livres anciens. Bibliophile Bookbase for antiquarian books, maps and prints. |