Chin, Alan K.; Wang, S. C.; Dutta, Niloy K.; Linden, Kurt J: Testing, Reliability, and Applications of Optoelectronic Devices (SPIE Proceedings Volume 4285)

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Chin, Alan K.; Wang, S. C.; Dutta, Niloy K.; Linden, Kurt J : Testing, Reliability, and Applications of Optoelectronic Devices (SPIE Proceedings Volume 4285)

SPIE, 2001

ISBN 0819439630

4to - over 9¾ - 12" tall. 0819439630 | Yellow covers. Clean pages, tight binding. Card pocket but not other library markings. 246 pages.. Book. Book Condition: Very Good Ex-Library Condition. Binding: Soft cover

Chin, Alan K.; Wang, S. C.; Dutta, Niloy K.; Linden, Kurt J : Testing, Reliability, and Applications of Optoelectronic Devices (SPIE Proceedings Volume 4285) is listed for sale on Bibliophile Bookbase by Mountainview Books.

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