Buy this book on-line Stavola, Michael : Identification of Defects in Semiconductors, Volume 51A and 51B, 2 Volume SetAcademic Press, Incorporated, New York, 1998 ISBN 0127521593
8vo - over 7¾ - 9¾" tall. 0127521593 | Volume 51A covers: EPR and ENDOR studies of defects in semiconductors; magneto-optical and electrical detection of paramagnetic resonance in semiconductors; magnetic resonance of epitaxial layers detected by photoluminescence; uSR on muonium in semiconductors and its relation to hydrogen; positron annihilation spectroscopy of defects in semiconductors; the Ab initio cluster method and the dynamics of defects in semiconductors; index. Volume 51B covers: optical measurements of point defects; defect identification using capacitance spectroscopy; vibrational spectroscopy of light element impurities in semiconductors; defect processes in semiconductors studied at the atomic level by transmission electron microscopy; scanning tunneling microscopy of defects in semiconductors; perturbed angular correlation studies of defects; index. Maroon boards with gold lettering. Some library markings; no card pocket. Both volumes are clean and tightly bound.. Book. Book Condition: Very Good Condition. Binding: Hardcover Click here for full details of this book, to ask a question or to buy it on-line. Bibliophile Bookbase probably offers multiple copies of Stavola, Michael : Identification of Defects in Semiconductors, Volume 51A and 51B, 2 Volume Set. Click here to select from a complete list of available copies of this book. Bibliophile Bookbase lists over 5 million books, maps and prints including collectables, used books, incunabula, out-of-print books and libri antichi. Bibliophile Bookbase for antiquarian books, maps and prints. |